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Fields of Scientific Interests:

Secondary Ion Mass Spectrometry (SIMS) technique

Solar cells based on Cu(In,Ga)Se₂ (CIGS) absorbers and
electrical characterization of semiconductor devices by: C-V, I-V, Admittance Spectroscopy, Drive Level Capacitance Profiling (DLCP) and Hall effect

micro- and nanoparticles (particularly pollutant particles)

Vacuum Technology

SCAPS, TRIM, SIMION symulations